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MT6133

MT6133

MT6133

The MT6133 Memory Test System is a next-generation memory test system for evaluation analysis and mass production. MT6133 is developed to support various types of memory devices for 300mm wafer lines while significantly improving cost performance.

 

Basic Specifications

Maximum operating frequency: 444 MHz/ 888 Mbps

Overall timing accuracy: ±300ps, DRV/CMP ±150ps  

Maximum number of parallel DUTs: 1536(* 2bit type)/ TH

Test Head: 2 units (Each test head is capable of measuring a different device.)

Device to measured: DRAM, SRAM, PSRAM, Flash, MCP, hybrid memory ASIC

※ In case of 'E' option: Specification of RDC is upgraded to 32RDC.

 


成立於1933年的YIKC是韓國發展半導體產業的重要推手之一,多年來持續大量投入研發資源,開發記憶體測試設備,不論在產能、產品性能或是產品可靠度上都深受客戶肯定,合理價格提供的優質測試平臺在韓國具有可觀的市占率,更是韓國三星等國家重點扶植企業的重要策略合作夥伴。