Spirox Corporation
Spirox Corporation
  • About Spirox
    SPIROX
    About Spirox
    Spirox
    Jetek
    Southport
  • Products
    PRODUCTS
    Products
    Spirox Laser Tomography Scan System
    • Non-Destructive TGV Laser Modification Inspection System
    • Non-Destructive TSV Inspection System
    Semiconductor IC Testing Equipment
    • ATE
    • Handler
    • Prober
    • Interface
    Semiconductor Packaging Equipment
    • Reflow Oven
    • Plasma Cleaner
    • TCB Bonder
    • Automatic Wirebonding Measurement Equipment
    • Warpage Adjustment
    • Thermal Debonding
    Lab Wafer and Chip Inspection Equipment
    • Surface Topography Inspection and Material Characteristic Analysis
    • Defect Inspection
    • FA
    • ESD
    Mass Production Chip Inspection Equipment
    • Automated Optical Inspection (AOI)
    • Defect Inspection
    ATE/Prober Board Repair Service
    • ATE/Prober Board Repair Service
    Accessories
    • Chuck
    • Probe Pin
    • Automation Equipment
    • Silicon Materials and Wafers
  • Applications
    APPLICATIONS
    Applications
    Advanced Packaging
    • TGV Laser Modification Inspection
    • TSV Defect Inspection
    • CPO(Co-Packaged Optics)
    • CoWoS
    • Hybrid Bonding
    • Reflow
    Raman/PL Spectroscopy
    • Jewelry, Antiquities, & Material Analysis
    • Semiconductor & MicroLED Research
    • Toxicology & Environmental Testing
    • Biomedical Testing
    Photoluminescence, PL
    • Surface Topography Inspection
    • MicroLED Inspection
    • Single-Molecule Imaging
    • Biomedical Imaging
    • Material Surface Distribution Analysis
    • SiC/GaN Inspection
    RF Front-End Module (FEM)
    • PA, LNA
    • RF Switch, RF Filter, RF FEM
    • Sub-6, mmWave
    Digital & Mixed Signals
    • MCU, AD/DAC, Audio/Video
    RF & Wireless
    • MEMS & Sensors Connectivity
    MEMS Sensor Device
    • Magnetometer
    • Accelerometer
    • MEMS Microphone
    • Gyroscope
    • Pressure Sensor
    Power Semiconductor Test
    • Known Good Die (KGD)
    • Direct Bonded Copper (DBC)
    • Power Device
    • Power Module
    • Power Device/Module Reliability Test
    • Power Module Packaging
    • Power Module Pin Insertion
    Compound Semiconductor
    • Defect Inspection
    • Known Good Die (KGD) Test
    • Direct Bonded Copper (DBC)
    • Power Device
    • Power Module
    • Power Device/Module Reliability Test
    • Power Module Packaging
    • Power Module Pin Insertion
    Failure Analysis
    • EFA
    • ESD
    Semiconductor Packaging
    • Reflow
    • Vacuum Reflow
    • Plasma Cleaning
    • TCB Bonder
    • Wire Bond Measurement
    • Multi-Layer Thickness Measurement
    • eWLB Warpage Adjustment
    • eWLB Thermal Debonding
  • Partners
  • News
    NEWS
    News
    Latest News
    Financial News
    Events
    Latest News
    Financial News
    Events
  • Human Resource
    HUMAN RESOURCE
    Human Resource
    Overview
    Core Value
    Career Development
    Compensation & Benefits
    Spirox Life
    Join Spirox
  • Investors
    INVESTORS
    Investors
    Company Information
    • Organization
    • Department Functions
    • Internal Policies and Principles
    • Corporate Sustainability
    • Stakeholder Engagement
    Corporate Governance
    • Corporate Governance Structure
    • Board of Directors
    • Functional Committees
    • Performance Evaluation of the BOD & Committees
    • Internal Audit
    • Ethical Corporate Management
    • Irregular Business Conduct Reporting
    • Human Rights Policy
    • Intellectual Property Management Plan
    Financial Information
    • Monthly Revenue
    • Quarterly and Annual Reports
    Shareholder Services
    • Material Information
    • Dividends
    • Shareholders' Meeting
    • Major Shareholders
    • Earnings Conference
Language
  • EN
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Company Information

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Organization

Department Functions

Internal Policies and Principles

Corporate Sustainability

Stakeholder Engagement