PRODUCT DESCRIPTION
产品介绍
PRODUCT DESCRIPTION
NeoKGD是一个标准测试平台，通过灵活的配置选项，满足客户在KGD测试和分选方面的需求。从测试条件(环境、温度、静态和动态测试)到探针技术(探针卡)，NeoKGD能够根据客户的要求提供适合的设置，以达到高效、精准的良品输出及不良品分选。
FEATURES
产品特色
FEATURES
每小时高达1,800个单位的高吞吐量设计
配备高速光学检测系统，能够于晶粒针测及最终测试(高温或环境温度)进行自动分选
占地面积小，提升厂房空间利用率
PRODUCT SPECIFICATIONS
产品规格
PRODUCT SPECIFICATIONS
| KGD 测试分类机 - NeoKGD | ||
|---|---|---|
| Input Media | 6”, 8” or 12” Wafer Frame | |
| Output Media |
Reconstructed Wafer Frame 2”, 4” Waffle and Gel Pack Tape & Reel Jedec or Custom Tray form |
|
| Reject Media |
Bin Boxes 2”, 4” Waffle and Gel Pack |
|
Supported Tests |
AC, DC, Hi-Pot Test | |
| Temperature Control |
|
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| Optical Inspection | 5s, 6s, Hi-Speed Capabilities | |
| Probe Card Features |
Automatic Alignment (Probe Needles and Die) Automatic Cleaning Embedded Locking System with ATE Direct Docking Capability |
|
| Factory Integration |
SECS/GEM Interface Wafer Map Management (according to the SEMI standards) Lights-off concept ready (Robotization, AGVs) |
|
| Equipment KPIs |
Compact footprint Overall Equipment Efficiency (OEE) : ≥ 92% Mean time between failures (MTBF): ≥ 1,680 hours Jam rate : ≤ 1:10k Conversion time between product/packages ≤ 15 mins Mean time to assist (MTTA) in Production Mode: less than 3 minutes for hard jam only |
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