Multitest's well-established MT9510 tri-temp pick and place handler is now available with various site pitch layouts, which are compatible with major standard handlers in the market. The new site pitch layouts enable to customer to re-use existing loadboa
DCG Systems announced today that it has acquired the assets of MultiProbe, the leading provider of atomic force-based nanoprobing solutions for the semiconductor industry.
Multitest adds an MRS module for sensor test on the MT9510 handler to the MEMS/sensor test product line. The module allows for x and y axis testing of magnetic sensors on a flexible and well-established pick and place handler platform.
LTX-Credence today announced that Nordic Semiconductor has selected Xcerra's LTX-Credence Diamondx for high volume production test of their Internet of Things (IoT) products.
Multitest shipped the first "Shaker" 45° high g sensor test module, which allows for a two axis testing with one single stimulation on a flexible and modular handler platform, for the MT9928 to a major international IDM.
Multitest is launching the first InCarrierplus with the shipment to a major IDM with high volume production. It is the new state-of-the art loading solution for test in carriers, and is designed to optimize the back-end process at high volume production
Multitest has launched the new Link Contactor product line for analog, mixed signal, and RF applications. The innovative vertical probe design combines advantageous mechanical features with superior electrical performance.
Multitest successfully introduced a new solution to their MEMS test and calibration portfolio: Multitest InBaro for high parallel test of barometric sensors.
The Multitest ATC option for the MT2168 pick-and-place handler offers a most cost-efficient and flexible solution for managing low to medium range power dissipation at multisite test cells with up to 16 sites.