LED Tester System
Jetek LED Tester provides two measurement methods: Integrating Sphere (luminous flux; lm) and Measuring Sleeve (luminous intensity; mcd). It utilizes customized communication patterns and power control to achieve the characteristics of optics and electrical measurement.
PRODUCT DESCRIPTION
PRODUCT DESCRIPTION
| Test Item | |
|---|---|
|
Electrical parameters |
|
|
Optical parameters |
|
|
OTP trimming |
|
FEATURES
FEATURES
Built-in digital board (100MHz with PPMU, active load)
Support various communication interfaces (UART, I2C, SPI)
Support burn-in function
Support integrating sphere/optical tube measurement
Photoelectric integration test (LED + MCU)
Support large-scale and accurate measurement
- Current Range: 10μA, 100μA, 1mA, 10mA, 100mA, 500mA
- Current Resolution: 150pA, 1nA, 10nA, 100nA, 1μA, 5μA
- Voltage Range: ±6V
- Voltage Resolution: 60μV
PRODUCT SPECIFICATIONS
PRODUCT SPECIFICATIONS
| LED Tester System | |
|---|---|
| CCD | Toshiba TCD 1304DG |
| Number of Pixels | 3,648 |
| Pixel Size | 8μm x 200μm |
| Spectral Range |
SSE-1304-U: 350nm ~ 1,000nm SSE-1304-UW: 200nm ~ 1,000nm |
| Pixel Output Clock | 0.5MHz |
| Data Storage on Camera | 4 Frames |
| ADC Resolution | 16 bites |
| External Trigger | Y |
| Exposure Time Range | 0.1ms ~ 6,500ms |
| GPIO |
Y (4 programmable I/O's) |
| Frame Rate | 138 scans / second |
| Host Interface | USB 2.0 |
